BIST for Logic and Memory Resources in Virtex-4 FPGAs

We present a Built-In Self-Test (BIST) approach for testing and diagnosing the programmable logic and memory resources in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The resources under test include the programmable logic blocks (PLBs) and block random access memories (RAMs) in all of their modes of operation. The BIST architecture and configurations needed to completely test these resources are presented. The BIST approach exploits architectural and operational features of the Virtex-4 FPGA to reduce the amount of storage required for BIST configuration data as well as the total testing time required for testing the FPGA.